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商品編號：CB23738 碟片數量：1片 銷售價格：200 瀏覽次數：26622 
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商品描述
Datasqueeze v2.2.9 Linux and MacOSX (X射線分析軟體) 英文破解版
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軟體簡介:
Datasqueeze 是一款X射線分析軟體。其圖形介面介面可以進行2維的X射線衍射探
測資料分析，特別適合於分析粉狀衍射資料，聚合體或液晶散射，膠體、聚合體、
凝膠體或溶液小角度散射等。運行於Windows、Linux及Macintosh OS X作業系統，
用戶介面友好。
Datasqueeze 2.2 is a graphical interface for analyzing data from 2D x-ray
diffraction detectors (wire, image plate, CCD), running on Windows,
Linux, and Macintosh OS X. The interface is simple and intuitive, and the
program is easy to use even for those new to x-ray diffraction analysis.
Datasqueeze is particularly useful for the analysis of powder diffraction
data, diffuse scattering from polymers or liquid crystals, or small-angle
scattering from colloids, polymers, gels, or solutions.
New features in Version 2.2:
Make and display "movies" of XRD images.
Improved options for scripted operations.
User-selectable output file resolution.
Introduced a graphical tool to assist in least-squares refinements of peak
profile.
The available models for least-squares analysis have been expanded and
improved.
It is now possible to analyze images collected with the detector rotated
far from the beam zero orientation ("Wide Angle Scattering")
軟體簡介:
Datasqueeze 是一款X射線分析軟體。其圖形介面介面可以進行2維的X射線衍射探
測資料分析，特別適合於分析粉狀衍射資料，聚合體或液晶散射，膠體、聚合體、
凝膠體或溶液小角度散射等。運行於Windows、Linux及Macintosh OS X作業系統，
用戶介面友好。
Datasqueeze 2.2 is a graphical interface for analyzing data from 2D x-ray
diffraction detectors (wire, image plate, CCD), running on Windows,
Linux, and Macintosh OS X. The interface is simple and intuitive, and the
program is easy to use even for those new to x-ray diffraction analysis.
Datasqueeze is particularly useful for the analysis of powder diffraction
data, diffuse scattering from polymers or liquid crystals, or small-angle
scattering from colloids, polymers, gels, or solutions.
New features in Version 2.2:
Make and display "movies" of XRD images.
Improved options for scripted operations.
User-selectable output file resolution.
Introduced a graphical tool to assist in least-squares refinements of peak
profile.
The available models for least-squares analysis have been expanded and
improved.
It is now possible to analyze images collected with the detector rotated
far from the beam zero orientation ("Wide Angle Scattering")